- Видео 144
- Просмотров 130 110
EDAX
Добавлен 30 авг 2012
Gatan and EDAX have merged. The combined organization will retain the Gatan name, offering the ultimate suite of tools for transmission electron (TEM) and scanning electron (SEM) microscopes.
We are a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectrometry (EDS), Wavelength Dispersive Spectrometry (WDS), Electron Backscatter Diffraction (EBSD), and Micro X-ray Fluorescence (µXRF).
The EDAXNews Channel is intended to be a source of informative and educational videos about techniques and resources from our experts.
We are a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectrometry (EDS), Wavelength Dispersive Spectrometry (WDS), Electron Backscatter Diffraction (EBSD), and Micro X-ray Fluorescence (µXRF).
The EDAXNews Channel is intended to be a source of informative and educational videos about techniques and resources from our experts.
OIM Matrixによるシミュレーションパターンを用いたEBSDパターンの指数付け
AMETEK/EDAX社にて開発したEBSD解析ソフト OIM Analysis９は、シミュレーションパターンを用いた高機能指数付けソフトウェアがオプションとして装備されています。
本手法は従来のHough変換による指数付けに比べ、ノイズの多いパターンの指数付けに強く、また、良好なパターンでは高い角度分解能や、高度な相分離が望めます。
本セミナーでは、シミュレーションパターンを用いた指数付けの原理から実際の解析事例を中心に、OIM Analysis９へ追加された機能についても紹介させていただきます。
本手法は従来のHough変換による指数付けに比べ、ノイズの多いパターンの指数付けに強く、また、良好なパターンでは高い角度分解能や、高度な相分離が望めます。
本セミナーでは、シミュレーションパターンを用いた指数付けの原理から実際の解析事例を中心に、OIM Analysis９へ追加された機能についても紹介させていただきます。
Просмотров: 405
Видео
球形标定算法解决您纳米晶，大变形等EBSD困难样品的标定困境
Просмотров 1405 месяцев назад
电子背散射衍射（EBSD）是扫描电镜中研究晶体材料的利器，在材料科学（尤其是金属材料）的表征分析当中体现了重要的价值。据不完全统计，单2023年就有超过16000篇论文使用或者提及到了EBSD技术；截止2024年初，目前最快的EBSD标定速度也已经突破了6600点每秒。 然而，当EBSD用户面对一些极具挑战性的样品，尤其是包含纳米晶，剧烈变形还有对称性较差晶体结构的样品时，常规商用化EBSD在线标定所使用的霍夫变换法（Hough transform）将受到限制，最终导致材料的标定率不佳，无法得到用户理想的结果。 2018年以来，EDAX持续优化了基于花样匹配标定的解决方案，并商用化了字典算法（dictionary indexing）和球形标定法（spherical indexing），针对一系列挑战性样品，您也可以获得跟常规样品相似的接近100%的标定率。 在这次网络研讨会中，陆畅博...
EBSD-based correlative microscopy
Просмотров 3486 месяцев назад
Correlative microscopy is a method where the same area of a sample is imaged using different techniques. This allows various material properties to be linked with particular aspects of the microstructure. As electron backscatter diffraction (EBSD) provides vital information on crystallographic orientation, linking EBSD results with other characterization techniques allows a researcher to gain c...
Spherical indexing - See how to improve your EBSD data indexing and results
Просмотров 7807 месяцев назад
Gatan/EDAX, in conjunction with The Ohio State University Center for Electron Microscopy and Analysis' (CEMAS) 10th-anniversary celebration, invites you to attend this electron backscatter diffraction (EBSD) workshop. Electron backscatter diffraction (EBSD) is a well-established microanalytical technique for characterizing the crystal orientation of crystallographic materials. Spherical indexin...
Applications of EBSD for analysis of deformed high temperature materials
Просмотров 8808 месяцев назад
Electron backscatter diffraction (EBSD) has many uses for material analysis and is often complementary to other characterization techniques. This webinar will focus on three case studies of its application to high-temperature materials conducted at the Center for Electron Microscopy and Analysis (CEMAS) at The Ohio State University. Firstly, EBSD is shown as an input parameter to SEM-based cont...
Introduction to electron backscatter diffraction (EBSD)
Просмотров 3,8 тыс.10 месяцев назад
While electron backscatter diffraction (EBSD) was discovered in 1928 by Kikuchi, it wasn’t until the full automation of the technique in 1991 that the technique’s utility for characterizing microstructure was truly realized. EBSD is a scanning electron microscopy (SEM)-based technique that provides a practical means of quantifying and visualizing the crystallographic aspects of a polycrystallin...
Overcoming EBSD indexing challenges using spherical indexing and real space refinement in OIM
Просмотров 82310 месяцев назад
Traditionally, electron backscatter diffraction (EBSD) patterns have been indexed in OIM Analysis™ using a combination of the Hough Transform for detecting the bands in the patterns coupled with various band triplet indexing schemes. While this approach has proven robust, it can struggle with samples that produce low-quality patterns. Even with high-quality patterns, the traditional approach is...
The influence of the mode of deformation on recrystallization kinetics in Ni and Ti
Просмотров 399Год назад
In this webinar, we will present the effect of deformation mode (rolling and torsion) on the microstructural heterogeneities and subsequent recrystallization kinetics in a commercial purity Ni and Ti. In Ni, for a given equivalent von Mises strain, samples subjected to torsion have shown a higher fraction of recrystallization nuclei density (evaluated using grain orientation spread from EBSD sc...
APEX 3.0 WDSソフトウェアのご紹介
Просмотров 142Год назад
新しいAPEX 3.0ソフトウェアは、エネルギー分散型X線分析（EDS）、電子線回折結晶方位解析（EBSD）、波長分散型X線分析（WDS）を統合した究極の材料特性評価ソフトウェアで、これまで実現不可能だったソリューションを提供します。この最適化された構成は、各技術の妥協のない性能を提供し、ユーザーはこれらを組み合わせることによって、究極の材料に関する洞察を得ることができます。3つの技術はすべてAPEXソフトウェアでシームレスに動作し、直感的なインターフェースを介して強力な元素分析と結晶構造解析を融合し、あらゆるレベルのユーザーに対して優れたデータ収集、迅速な分析、柔軟なレポート作成を提供します。このウェビナーでは、このソフトウェアに最近追加されたWDSの機能とアプリケーションの例をご紹介します。
Advances in EDS and EBSD
Просмотров 475Год назад
This webinar, in conjunction with the Center for Electron Microscopy and Analysis (CEMAS) at The Ohio State University, will focus on examples of how advances in energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD) can help improve your analysis. The webinar will be broken down into two talks: 1) High-precision EBSD from spherical harmonic indexing and 2) Few compell...
Introducing APEX 3 0 Software - now with EDS, EBSD, and WDS
Просмотров 441Год назад
The new APEX 3.0 software is the ultimate materials characterization software suite integrating energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), and wavelength dispersive spectrometry (WDS) to deliver previously unattainable solutions. This optimized configuration offers the uncompromised performance of each technique and allows users to combine them for the ultima...
「OIM - 新時代」OIM-A9 の新機能のご紹介
Просмотров 584Год назад
弊社では、今春OIM-A9をリリースする予定です。OIMではOIM-A8から解析ソフト上で保存されたEBSDパターンの再指数付けができるようになっています。従来のHough変換に基づいた指数付けは、高速に動作させることができ、非常に有用な手法です。しかし、この手法は不鮮明なパターンに対しては、精度の高い指数付けは困難となってしまいます。この問題を解決するために、シミュレーションパターンに基づいたDictionary Index法をOIM-A8.6で導入しました。しかし、計算が非常に重くあまり実用的ではありませんでした。OIM-A9では同じシミュレーションパターンに基づいた指数付けですが、パターンの参照方法を改善し、従来のHough変換法に基づいた遜色のない速度で指数付けが可能なSpherical Index法を開発し組み込むことに成功しました。本セミナーでは、このSpherical ...
EDAX Velocity Ultra EBSD Detector
Просмотров 225Год назад
The Velocity™ Ultra EBSD Detector offers the fastest EBSD mapping for routine, 3D, and in-situ materials characterization. It allows you to shorten your time to results and produces high-quality, accurate orientation data on the widest range of materials. This video demonstrates the Velocity Ultra running at speeds above 6,400 indexed points per second to produce a beautiful EBSD map of a 316L ...
Establishing EDS Quantification with Standards as a Technique for Everyday Use with FSQ in APEX
Просмотров 614Год назад
With the latest APEX software, EDAX enables extensive flexibility in quantifying energy dispersive spectroscopy (EDS) analyses. While the eZAF model considers matrix effects, PeBaZAF is useful for geometrically demanding materials that use the peak-to-background ratio instead. Standardless normalized quantification is the most widely used approach due to its ease of use, fast and ready-to-use r...
EDX Quantifizierung mit Standards als alltagstaugliches Verfahren durch FSQ in APEX
Просмотров 304Год назад
EDAX ermöglicht mit der neueste APEX Software umfassende Flexibilität in der Quantifizierung von EDX Analysen. Während standardmäßig das eZAF Model Matrix Effekte berücksichtigt, kann für geometrisch anspruchsvolle Materialien PeBaZAF verwendet werden, bei welchem das Peak zu Untergrund Verhältnis zur Berechnung herangezogen wird. Aufgrund der Benutzerfreundlichkeit, der schnellen und einsatzbe...
Using EBSD and TKD for New Insights on the Cold Spray Deposition Process
Просмотров 684Год назад
Using EBSD and TKD for New Insights on the Cold Spray Deposition Process
New Tools for EBSD Data Collection and Analysis
Просмотров 786Год назад
New Tools for EBSD Data Collection and Analysis
Current Issues with Data Presentation and Publication
Просмотров 1,6 тыс.Год назад
Current Issues with Data Presentation and Publication
Determining Lithium Content by the Composition by Difference Method
Просмотров 8552 года назад
Determining Lithium Content by the Composition by Difference Method
Resolving crystallographically similar phases for more accurate characterization
Просмотров 2412 года назад
Resolving crystallographically similar phases for more accurate characterization
Developing Clarity - Applications of Direct Detection for Electron Backscatter Diffraction
Просмотров 3292 года назад
Developing Clarity - Applications of Direct Detection for Electron Backscatter Diffraction
Comparing 2D and 3D mesoscale measurements to examine slip transfer through GBs in Ti & Ti-5Al-2.5Sn
Просмотров 3882 года назад
Comparing 2D and 3D mesoscale measurements to examine slip transfer through GBs in Ti & Ti-5Al-2.5Sn
Characterizing Glass Fragments Using Micro-XRF Intensity Ratios
Просмотров 1792 года назад
Characterizing Glass Fragments Using Micro-XRF Intensity Ratios
Spectrum Library Matching: Correlating Phase Map Spectra with Library Matching
Просмотров 1992 года назад
Spectrum Library Matching: Correlating Phase Map Spectra with Library Matching
Smart SDD Technology with Quantitative Routines for Applied TEM Analysis
Просмотров 702 года назад
Smart SDD Technology with Quantitative Routines for Applied TEM Analysis
Shattering EDS Performance Limits with Elite Technologies
Просмотров 1272 года назад
Shattering EDS Performance Limits with Elite Technologies
X線マイクロアナリシス ～ミクロからマクロまでSEM＋EDS/WDS とμEDXRF分析～
Просмотров 2142 года назад
X線マイクロアナリシス ～ミクロからマクロまでSEM＋EDS/WDS とμEDXRF分析～
Beam Sensitive Samples and EDS Analysis
Просмотров 3582 года назад
Beam Sensitive Samples and EDS Analysis
Could you use Silicon Nitride for normal house windows?
Hi Oliver, Silicon Nitride has many uses and been in play for over 20 years but not for house windows as far as we know! For more information, please see www.azom.com/article.aspx?ArticleID=53 It is difficult to produce in bulk and considering the cost, it doesn’t really lend itself to be used for windows especially if in large areas.